简介:WhenweuseMOCVDtechnique,anexcellentCdTeepi-layerwasgrownonGaAssubstratesandtheCdTe/GaAshybridsubstratessuitableforgrowingHg1-xCdxTe(CMT)wereobtained.ThexvalueinCMTisbetween0.2and0.8.TheelectricalpropertiesofCMTdependuponthethicknessofCdTeepi-layers.TheCdTe/GaAsinterfacewasexaminedbybothscanningelectronmicroscope(SEM)andelectronaugerspectra(EAS).TheinfluenceofdefectsobservedatinterfaceonelectricalandopticalpropertiesofCMTfihnswasdis-cussed.
简介:High-strainInGaAs/GaAsquantumwells(QWs)aregrownbylow-pressuremetal-organicchemicalvapordeposition(LP-MOCVD).Photoluminescence(PL)atroomtemperatureisappliedforevaluationoftheopticalproperty.Theinfluenceofgrowthtemperature,V/IIIratio,andgrowthrateonPLcharacteristicareinvestigated.ItisfoundthatthegrowthtemperatureandV/IIIratiohavestrongeffectsonthepeakwavelengthandPLintensity.Thefull-widthathalf-maximum(FWHM)ofPLpeakincreaseswithhighergrowthrateofInGaAslayer.TheFWHMofthePLpeaklocatedat1039nmis20.1meV,whichgrowsat600°CwithV/IIIratioof42.7andgrowthrateof0.96mm/h.
简介:GaxIn1-xAs1-ySbyalloyshavebeengrownbyatmosphericpressureMOCVDonn-GaSb(Te-doped)substrate.Thesohdcompositionwasdeterminedbyusingelectronmicroprobe.ThealloysofGalnAsSbwithcompositioninmiscibilitygapweresuccessfullygrown.TheopticalpropertiesofGaxIn1-xAs1-ySbylaverswerecharacterizedbythephotoluminescenceandtheinfraredabsorption.Thespectralresponsesofp+-GaInAsSb/p-GaxIn1-xAs1-ySby/n-GaSbdetectorsshowedwavelengthcutoffat2.4μmanddetectivity-D*=5×108cmHz1/2/Watroomtemperature.
简介:Zinctinoxide(ZTO)thinfilms,withzincacetateandtributyltinchlorideasrawmaterials,weredepositedonglasssubstratesbythemethodofmetalorganicchemicalvapordeposition(MOCVD).Thecrystallization,microstructureandopticalpropertieswereinvestigatedbyscanningelectronicmicroscope(SEM),X-raydiffraction(XRD)andultraviolet-visible(UV-Vis)spectrophotometer.TheresultsshowthatwiththeincreaseinSn/Znratio,thecrystalchangesfromwurtzitetorutilephase.Whentheratioreaches11:18,theintensityofZn_2SnO_4peaksappearstobethestrongestandtheopticalbandgapisabout3.27eV.Calculatedbytheenvelopemethod,thethicknessoftheZTOthinfilmsis713.24nm.MeasuredbyUV-Visspectrophotometer,thetransmittanceoftheZTOthinfilmsreachesupto80%inthewavelengthrangeof400-1000nmwhentheSn/Znratiois7:18.
简介:Theprogramprocessofthelongitudinalimpurityprofileintroducedinthequantumwell(QW)laserandmicrowaveelectronicmaterialsinanalysed,basedonthegrowthsystembymetalorganicchemicalvapordeposition(MOCVD)andmicrowaveelectronicmaterialsandchloridevaporphaseepitaxy(VPE).Thequantitativesolutionofthefinallongitudinaldirectionimpuritydistributionusingthemathematicalphysicsmodelofimpuritycarrier-gastransportdriftandrediffusioningrowthprocesswascarriedout.Atechnologyforgivingareferencetogrownimputityprofileofabruptdopinganduniformlongitudinaldirectionbasedonthetheoryispresented.
简介:TheMOCVDgrowthofmodifiedAlAs/GaAsdoublebarrierresonanttunnelingdiodes(DBRTD)withanA1GaAschairwasreported.Theresonancestothefirstexcitedstateswereobtained.Thepeak-to-valleycur-rentratio(PVCR)is1.3at77K,roomtemperaturepeakcurrentdensityis8kA/cm~2.Theresonancevoltagesareinagreementwiththetheoreticalapproachbytransfer-matrixmethod.Influenceofinterruptedgrowthtimeatthehetero-interfaceandincorporationoftheAlGaAschairtothedeviceperformanceswerestudiedandthemechanismwasdiscussed.TheattempttoaddanAlGaAschairtotheDBRTDbyMOCVDresultedinimprovementinthePVCRandpeakcurrentdensity.
简介:我们在场一个样品栅栏的整体的集成散布了布拉格有由联合的一个量井electroabsorption调节的人(QW电动会计记帐机)的反射镜(SG-DBR)激光极端低压(55mbar)selective-area-growth(下垂)金属器官的化学蒸汽免职(MOCVD)和使混合的量井(QWI)第一次。QW电动会计记帐机和获得节能被使用同时种下垂MOCVD技术。同时,QWI技术提供在二功能的节之间的一个突然的乐队差距变化,它减少内部吸收损失。试验性的结果证明阀值电流Ith=62妈,和产量功率到达3.6mW。调节范围封面30nm的波长,和所有相应方面模式抑制比率是超过30dB。在可得到的波长隧道的扑灭比率能与-5V的偏爱到达超过14dB。[从作者抽象]