简介:为了明确团聚现象及表面性质对ZnS纳米材料发光性质的影响,采用SiO2对ZnS材料进行了表面修饰,并对ZnS及ZnS/SiO2复合材料的光学性质进行对比研究。采用吸收光谱分析了包覆前后光吸收性质的差异,发现SiO2包覆后ZnS纳米材料的带边由333nm红移至360nm。为了研究ZnS纳米材料与ZnS/SiO2纳米复合材料的光发射性质,分别对含纳米材料的水溶液样品及粉末样品的发光光谱进行了采集。对比研究的结果表明,SiO2包覆后ZnS纳米材料在蓝紫光区的发光得到了明显增强。以氙灯作为激发光源所获得荧光光谱显示ZnS/SiO2粉末样品发光的积分强度增大为原来的17.5倍,但相同条件下针对溶液样品的测试结果显示其发光强度只增大了1.1倍,这种增强可用SiO2的存在抑制了ZnS纳米粒子间的团聚来解释,且这一推断由325nm紫外激光激发下获得的光致发光数据进行了验证。
简介:Inthiswork,MoOxpromotedIr/SiO2catalystswerepreparedandusedfortheselectivehydrogenolysisoftetrahydrofurfurylalcohol(THFA)to1,5-pentanediolinacontinuousflowreactor.Theeffectsofdifferentnoblemetals(Ir,Pt,Pd,Ru,Rh),supportsandIrcontentswerescreened.Amongtheinvestigatedcatalysts,4wt%Ir-MoOx/SiO2withaMo/Iratomicratioof0.13exhibitedthebestcatalyticperformance.ThesynergybetweenIrparticlesandthepartiallyreducedisolatedMoOxspeciesattachedonthemisessentialfortheexcellentcatalyticperformanceofIr-MoOx/SiO2.ThecatalystexhibitedabetterhydrogenolysisefficiencyofTHFAwiththeselectivityof1,5-pentanediolof65%–74%ataconversionofTHFAof70%–75%whentheinitialTHFAconcentrationisrangingfrom20wt%and40wt%.AndhighersystempressurewasalsoinfavoroftheconversionofTHFA.Duringastabilitytest,theconversionofTHFAand1,5-pentanediolyieldoverIr-MoOx/SiO2decreasedwithreactiontime,whichcanbeexplainedbytheleachingofMospeciesduringthereaction.
简介:目的:研究十余种室内典型空气污染物的光催化净化新方法,为下一步研制空气净化装置奠定实验基础。方法:将纳米级TiO2复合某种金属氧化物制成光催化剂,在紫外灯光照下,测定污染物的消除率。结果:组方为90%TiO2+10%金属氧化物的光催化刑对有害气体净化效果最佳,对H2S净化率在97%以上,对SO2净化率99%以上,对NO2、NH3能够全部消除,对CS2平均净化率为81.3%,对苯平均消除率仅为8.8%,对甲苯仅为18.8%,对二甲苯仅为41.6%。结论:研制的光催化剂,可有效消除S02、H2S、NO2、NH3、CS2等有害气体。但对苯系物及C0、CO2等催化效率较低或没有效果,如何提高光催化剂对这些化合物的净化效率是今后研究工作的重点。
简介:用滚镀的方法在金刚石表面镀Ni层和纳米Si3N4/Ni复合镀层,用扫描电子显微镜观察金刚石镀前和镀后的表面形貌,用DKY-1型单颗粒抗压强度测定仪测量金刚石单颗粒的抗压强度。用热压烧结的方法得到铁基结合剂金刚石节块,在INSTRON-5569型万能材料试验机上测量节块的抗弯强度,在NMW-1立式万能摩擦磨损试验机上测试节块的耐磨性。结果表明:在金刚石表面镀Ni层和纳米Si3N4/Ni复合镀层后,表面镀层均匀,纳米Si3N4/Ni复合镀层比纯Ni层更致密,更平滑,晶粒更细小;纳米Si3N4/Ni复合镀层金刚石单颗粒有更高的抗压强度;纳米Si3N4/Ni复合镀层金刚石铁基结合剂节块有更高的抗弯强度和更优良的耐磨性。
简介:采用离子束辅助沉积法(IBAD)在单晶硅片上制备了Ti-Si-N纳米复合薄膜,研究了轰击能量大小对Ti—Si—N纳米复合薄膜生长及力学性能的影响,同时探讨了轰击能量对Ti—Si—N纳米复合薄膜的生长机理的影响。通过原子力显微镜(AFM)、纳米压人仪、光电子能谱(XPS)和X射线衍射分析(XRD)等现代分析技术,对Ti—Si—N纳米复合薄膜的晶粒大小、力学性能、成分与相结构进行综合表征分析。试验结果表明:当轰击能量为700eV时,Ti-Si-N薄膜晶粒直径达到了最小值11nm,此时Ti-Si-N薄膜的硬度相对最高,为33GPa。
简介:<正>“Privacy”istranslatedasyinsiinChinese.Traditionally,intheChinesemind,yinsiisassociatedwithsomethingthatisclosedorunfair.Ifsomeoneissaidtohaveyinsi,meddlers(好事者)willbeattractedtopry(打探)intohisorheraffairs.Sopeoplealwaysstatethattheydon’thaveyinsi.
简介:TheinvestigationonopticalpropertiesofSi1-xGex/Sistrainedlayerstructureshasbeencarriedoutactivelyinrecentyears.Thephotoluminescencehasbe-comeabriskersubjectinthestudiesofitsvariousopticalproperties.Aresearchdevelop-menttophotoluminescencepropertiesofsomenewSi1-xGex/Sistrainedlayerstruc-turesisintroduced.
简介:Theresidualelectricallyactivedefectsin(4×1012cm-2(30KeV)+5×1012cm-2(130KeV))si-implantedLECundopedsi-GaAsactivatedbytwo-steprapidthermalannealing(RTA)LABELEDAS970℃(9S)+750℃(12S)havebeeninvestigatedwithdeepleveltransientspec-troscopy(DLTS).TwoelectrontrapsET1(Ec-0.53eV,σn=2.3×10-16cm2)andET2(Ec-0.81eV,σn=9.7×10(-13)cm2)aredetected.Furthermore,thenoticeablevariationsoftrap’scon-centrationandenergylevelintheforbiddengapwiththedepthprofileofdefectsinducedbyionim-plantationandRTAprocesshavealsobeenobserved.The[Asi·VAs·AsGa]and[VAs·Asi·VGa·AsGa]areproposedtobethepossibleatomicconfigurationsofET1andET2,respectivelytoexplaintheirRTAbehaviors.
简介:FEBRUARY,2016RegulationsConcerningMenstrualPainLeaveaStepintheRightDirectionWomeninAnhuiProvincecantake1-2daysoffwhensufferingmenstrualpainsolongastheyprovideamedicalcertificate,accordingtothelatestlaborregulationsestablishedbytheAnhuiprovincialgovernment.Anhuiisnottheonlyprovincetotakethisstance.Otherregions,suchasJiangsuProvinceandGuangdongProvince,arealso
简介:PhotoconductivityCharacteristicsofPorousSi①CHAOZhanyun,WANGKaiyuan(DepartmentofElectronicEnginering,SoutheastUniversity,Nanji...