简介:Theopticalnoninvasivediagnosticofcharacteristicofsiliconsemiconductorde-vicesbyusingaInGaAsP/InPsemiconductorlaserasanopticalprobeisreported.Theprinci-pleofexperimentalmethodisbasedonthedependenceoftheopticalrefractiveindexonthecarrierchargedensityintheactiveregionofdevicesanddetectionofvariationofrefractiveindexbytwolaserbeaminterferometrictechniques.
简介:System-levelfaultidentificationisakeysubjectformaintainingthereliabilityofmultiprocessorinterconnectedsystems.Thistaskrequiresfastandaccurateinferencesbasedonbigvolumeofdata,andtheproblemoffaultidentificationinanunstructuredgraphhasbeenprovedtobeNP-hard(non-deterministicpolynomial-timehard).Inthispaper,weadoptthePMCdiagnosticmodel(firstproposedbyPreparata,Metze,andChien)asthefoundationofpoint-to-pointprobingtechnology,andasystemcontainsonlyrestricted-faultsifeveryofitsfault-freeunitshasatleastonefault-freeneighbor.Underthisconditionweproposeanefficientmethodofidentifyingrestricted-faultsinthefoldedhypercube,whichisapromisingalternativetothepopularhypercubetopology.