简介:[篇名]ANALYSISOFLOCALDEFECTSINSURFACEFILMSONCOMMERCIALALLOYSUSINGCONDUCTIVEATOMICFORCEMICROSCOPY(C-AFM),[篇名]Annealing-InducedPropertiesofAl-N-M(M:Co,Fe)ThinFilms,[篇名]Anodicoscillatorybehaviorandfilmformationonindiumphosphide,[篇名]Bias-temperatureinstabilitiesofpolysilicongateHfO{sub}2MOSFETs,[篇名]CommercializationofaSiliconNitridcCo-FireThrough(SINCOFT)processformanufacturinghighefficiencymono-crystallinesiliconsolarcells,[篇名]CopperCMPfordualdamascenetechnologysomeconsiderationsonthemechanismofCuremoval.
简介:Corrosionbehaviorofmetal/ceramicinterlacesinphysiologicalsolutions;Effectofleadonanodicbehaviorofalunainum;EffectofPost-detachmentCleaningontheHydrophilicNatureofNickelThinFihnNozzlePlatesforPiezolnk-ietPrinterHeads;Electrochemicalstudyforthecharacterizationofwetsiliconoxidesurfaces