Measurement of small wavelength shifts based on total internal reflection heterodyne interferometry

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摘要 ThisLetterpresentsamethodofanopticalsensorformeasuringwavelengthshifts.Thesystemconsistsofadiffractiongratingandatotalinternalreflectionheterodyneinterferometer.Asaheterodynelightbeamstrikesagrating,thefirst-orderdiffractionbeamisgenerated.Thelightpenetratesintoatotalinternalreflectionprismatananglelargerthanthecriticalangle.Awavelengthvariationwillaffectthediffractiveangleofthefirst-orderbeam,thusinducingaphasedifferencevariationofthelightbeamemergingfromthetotalinternalreflectionsinsidethetrapezoidprism.Boththeexperimentalandtheoreticalresultsrevealthat,forthefirst-orderdiffractivebeam,thesensitivityandresolutionlevelsaresuperiorto5°/nmand0.006nm,respectively,intherangeofwavelengthfrom632to634nm,andaresuperiorto3.1°/nmand0.0095nmintherangefrom632to637nm.Forthetheoreticalsimulationofthefourth-orderdiffractivebeam,theyaresuperiorto6.4deg∕nmand0.0047nmintherangefrom632to637nm.
机构地区 不详
出版日期 2016年08月18日(中国期刊网平台首次上网日期,不代表论文的发表时间)
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