THERMAL STRESS MEASUREMENT OF QUARTZ OSCILLATOR MODULE PACKAGING-中国期刊网

摘要 Thethermalstressofthequartzoscillatormodulepackagingisinvestigatedusingdistal-im-agecorrelationmethod(DICM),andtheexperimentalresultsaregiven.Underthequartzoscillatormodulepackaging,thequartzoscillatorandtheFe-Sn-Cualloyframearejoinedtogetherwiththeelectroconductiveadhesive(PI),andtheelectroconductiveadhesiveneedstobecuredtwiceat150℃and275℃respective-ly.AsthequartzoscillatorandtheFe-Sn-Cualloyframehaveadistinctdifferenceinboththermalexpansioncoefficientsandmechanicalpropertiesandinprocessofpackagingtemperaturerisesordrops,thethermalstressisyieldedeasily.Whiletemperaluredrops,thenormalstressatthequartzoscillatoredgeisatensilestress,whichcanmakethequartzoscillatorfracture.

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THERMAL STRESS MEASUREMENT OF QUARTZ OSCILLATOR MODULE PACKAGING

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THERMAL STRESS MEASUREMENT OF QUARTZ OSCILLATOR MODULE PACKAGING

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